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QPHY-USB3-Tx-Rx

QPHY-USB3-Tx-Rx

SuperSpeed USB is one of most highly anticipated standards in several years. At 10x the data rate of USB 2.0 and with new features like CTLE (continuous time linear equalization) and reference channels, SuperSpeed USB will pose new challenges to implementers.
QPHY-BroadR-Reach Automotive Ethernet enables faster data communication to meet the demands of today’s vehicles and the connected vehicles of the future. QPHY-BroadR-Reach automates testing and validation of 100 Mb/s Automotive Ethernet, which is described in both the BroadR-Reach and 100Base-T1 (IEEE 802.3bw) specifications.
DDR Debug Toolkit The DDR Debug Toolkit provides test, debug and analysis tools for the entire DDR design cycle. The unique DDR analysis capabilities provide automatic Read and Write burst separation, bursted data jitter analysis and DDR-specific measurement parameters.
ET-PMT Electrical Telecom Mask Test Package
GRL-USB-PD GRL-USB-PD software provides a simple and efficient way to perform USB-PD electrical parametric and protocol measurements. GRL-USB-PD provides waveform visibility and protocol analysis making it ideal for design and debug of USB Type-C Power Delivery silicon and end products.
GRL-USB-PD-C1 GRL-USB-PD-C1 is a flexible test controller, designed for USB-PD Compliance testing of the Unit Under Test (UUT) and more.
LNES Low Noise Edge Shaper
QPHY-10GBase-KR The Teledyne LeCroy QPHY-10GBase-KR solution automates testing for 10Gigabite Ethernet Copper Backplane base on the IEEE 802.3ap specifications. The test framework simplifies the test setup and execution of generic and common test requirements such as jitter separation, rise/fall time and transmitter equalization parameters. The guided wizard prompts the user to for specification required patterns and takes the measurements accordingly. The test report includes the test results pass/fail summary, margins and limits, as well as waveforms and measurements used during the test process.
QPHY-10GBASE-T QPHY-10GBASE-T automated compliance test software performs electrical compliance testing of the Physical Media Attachment (PMA) for 10GBASE-T Ethernet PHY, based on IEEE802.3-2008 requirements.
QPHY-DDR2 The Teledyne LeCroy QPHY-DDR2 Test Solution is the best way to characterize DDR2 memory interfaces. Capable of performing measurements on 400 MHz, 533 MHz, 667 MHz, 800 MHz, 1066 MHz and custom speed grades, QPHY-DDR2 has a full suite of Clock, Electrical and Timing tests as specified by the JEDEC Specification and Intel JEDEC Specifications Addendums.
QPHY-DDR3 The Teledyne LeCroy QPHY-DDR3 Test Solution is the best way to characterize DDR3, DDR3L, and LPDDR3 memory interfaces. Capable of performing measurements on 800 MT/s, 1066 MT/s, 1333 MT/s, 1600 MT/s, 1866 MT/s, 2133 MT/s and custom speed grades, QPHY-DDR3 has a full suite of Clock, Electrical, and Timing tests as specified by the JEDEC Specification.
QPHY-DDR4 DDR4 is an evolutionary upgrade from DDR3. It introduces data transfer rates which are nearly double the DDR3 transfer rates, ranging from 1.6 GT/s up to 3.2 GT/s. DDR4's higher transfer rates and lower operating voltage have driven new test methodologies and test requirements which were not previously required for DDR3 in order to ensure proper signal fidelity. QPHY-DDR4 has a full suite of Clock, Electrical, and Timing tests as specified by the JEDEC Specification which will aid in DDR4 design validation.
QPHY-DisplayPort The QPHY-DisplayPort software option provides an automated test environment for running all of the normative real-time oscilloscope tests for sources in accordance with Version 1.2b of the Video Electronics Standards Association (VESA) DisplayPort PHY Compliance Test Specification, as well as tests for HBR3 signals at 8.1 Gbps.
QPHY-eDP QPHY-eDP provides a highly automated and easy-to-use solution for Embedded DisplayPort source testing in accordance with version 1.4 of the VESA Embedded DisplayPort PHY compliance test guideline.
QPHY-ENET Ethernet testing compliant with IEEE 802.3-2005 requires many test setups and connections and mask tests. Using Teledyne LeCroy QualiPHY-ENET these measurements are easy to setup and complete. Instructive connection diagrams and message boxes appear as pop ups on the oscilloscope screen. The connection diagram instructs the user how to change test fixture and jumper pins in order to do complete test. When the tests are complete, QualiPHY will generate a test report in PDF, HTML, or XML formats. Jitter and pulse mask tests are performed with automatic waveform alignment, and all test results feature pass/fail indicators corresponding to the standard being tested.
QPHY-HDMI2 automated and easy-to-use solution for HDMI transmitter testing in accordance with Version 2.0 of the HDMI Compliance Test Specification (including testing for version 1.4 devices).
QPHY-LPDDR2 The Teledyne LeCroy QPHY-LPDDR2 Test Solution is the best way to characterize LPDDR2 memory interfaces. Capable of performing measurements on 466 MHz, 533 MHz, 667 MHz, 800 MHz, 900 Mhz, 1066 MHz and custom speed grades, QPHY-LPDDR2 has a full suite of Clock, Electrical and Timing tests as specified by the JEDEC Specifications.
QPHY-MIPI-DPHY - D-PHY Compliance Package Test Solution provides automated control for Teledyne LeCroy oscilloscopes for performing transmitter physical layer tests as described by the MIPI Alliance Specification for D-PHY version 1.00.00
QPHY-MIPI-MPHY The QPHY-MIPI-MPHY Test Solution provides automated control of Teledyne LeCroy oscilloscopes for performing transmitter physical layer tests as described by the MIPI Alliance Specification for M-PHY version 3.0.
QPHY-MOST150 The Teledyne LeCroy QPHY-MOST150 compliance test package provides a highly automated and easy-to-use solution to MOST compliance testing. QPHY-MOST150 will perform all electrical compliance tests as defined in the MOST150 oPHY Automotive Physical Layer Sub-Specification Rev. 1.1 and MOST150 cPHY Automotive Physical Layer Sub-Specification Rev 1.0.
QPHY-MOST50 The Teledyne LeCroy QPHY-MOST50 compliance test package provides a highly automated and easy-to-use solution to MOST compliance testing. QPHY-MOST50 will perform all electrical compliance tests as defined in the MOST Electrical Physical Layer Specification Rev. 1.1.
QPHY-PCIe The Teledyne LeCroy QPHY-PCIe Test Solution provides automated control for Teledyne LeCroy oscilloscopes for performing the entire transmitter physical layer tests as described by the Card Electro-mechanical specification Rev 1.1 and 2.0
QPHY-PCIe3 Teledyne LeCroy QPHY-PCIe3 Test Solution provides automated control for Teledyne LeCroy oscilloscopes for performing transmitter physical layer tests as described by the PCI Express Base Specification Revision 3.0 Version 0.9 and the Card Electromechanical Specification Revision 3.0 Version 0.7.
QPHY-SAS2 The Teledyne LeCroy QPHY-SAS2 Test Solution provides automated control for the SDA 8 Zi series of oscilloscopes for performing all of the transmitter physical layer tests as described by version 1.01 of the UNH IOL Serial Attached SCSI (SAS) Consortium SAS-2 6Gb/s Physical Layer Test Suite. This specification covers targets and initiators running at 1.5 Gb/s, 3.0 Gb/s and 6.0 Gb/s.
QPHY-SAS3 The QPHY-SAS3 Test Solution provides automated control of the SDA 8 Zi-A and LabMaster 10 Zi oscilloscopes for performing all of the transmitter physical layer tests as described by the T10 SAS-3 specification. This specification covers targets and initiators running at 1.5 Gb/s, 3.0 Gb/s, 6.0 Gb/s, and 12.0 Gb/s.
QPHY-SATA-TSG-RSG for SATA compliance testing to be used in conjunction with the PeRT3. By leveraging the capabilities of both the oscilloscope and the PeRT3, QPHY-SATA-TSG-RSG can automatically perform all of the PHY, TSG, OOB, and RSG tests as described by the SATA UTD 1.5. Furthermore, QPHY-SATA-TSG can be configured to test Gen1, Gen2, and Gen3 SATA PUTs.
QPHY-SFI The Teledyne LeCroy QPHY-SFI solution automates testing for SFI base on the SFF 8431 specifications. The test framework simplifies the test setup and execution of generic and common test requirements such as jitter separation, rise/fall time and transmitter equalization parameters. The guided wizard prompts the user to for specification required patterns and takes the measurements accordingly. The test report includes the test results pass/fail summary, margins and limits, as well as waveforms and measurements used during the test process.
QPHY-USB The USB package provides a complete acquisition and analysis system for USB 2.0 devices, hosts, and hubs, as specified in the USB-IF USB 2.0 Electrical Test Specification. The test software implements a full set of electrical tests for USB 2.0, including High-, Full-, and Low-speed tests and is supported by Teledyne LeCroy’s QualiPHY automated test and reporting software.
QPHY-USB3-Tx-Rx SuperSpeed USB is one of most highly anticipated standards in several years. At 10x the data rate of USB 2.0 and with new features like CTLE (continuous time linear equalization) and reference channels, SuperSpeed USB will pose new challenges to implementers.
QPHY-USB3.1-Tx-Rx QPHY-USB3.1-Tx-Rx offers an automated test package for USB 3.1 transmitter and receiver compliance testing, characterization, and debug.
Key Features
  • QPHY-USB3-Tx-Rx supports all transmitter compliance tests as described by the SuperSpeed USB Electrical Compliance Test Specification, and selected tests in accordance with the Universal Serial Bus 3.0 Specification
  • Complete automation of physical layer transmitter and receiver testing
  • SIGTEST electrical test software is fully integrated into the oscilloscope software
  • QPHY-USB3-Tx-Rx provides full reporting capability including Pass/Fail indications and screen - shots from pertinent tests
  • Eye Doctor II Advanced Signal Integrity Tools enable channel emulation and equalization which aids in debugging SuperSpeed USB compliance failures
  • SDA III allows fast eye diagram creation and jitter analysis on long memory acquisitions

SuperSpeed USB is one of most highly anticipated standards in several years. At 10x the data rate of USB 2.0 and with new requirements like CTLE (continuous time linear equalization) and reference channels, SuperSpeed USB will pose new challenges to implementers.

QPHY-USB3-Tx-Rx is an automated test package for SuperSpeed USB compliance testing. It provides connection diagrams to ensure the proper setup for the required measurements, automates the oscilloscope for performing these measurements, and provides a comprehensive report of results including screenshots.

The Teledyne LeCroy SDA 8 Zi Series of oscilloscopes with the Eye Doctor II analysis package are the perfect instruments for performing SuperSpeed USB compliance measure ments and more importantly for debugging compliance failures allowing the engineers to quickly find the root cause of serial data 
problems.

SDA II allows the user to quickly create eye diagrams utilizing the full record length of the oscilloscope and perform jitter analysis accurately, even when there is very long nonrepeating pattern jitter decomposition. This is critically important for properly distinguishing between random and deterministic jitter in systems containing a channel that severely stresses the signal.

Additionally, Eye Doctor II provides the channel emulation and de-embedding tools that engineers need for next generation serial data standards.

QPHY-USB3-Tx-Rx uses all of these oscilloscope features to perform the compliance tests as described by the USB 3.0 Electrical Test Specification.

The Teledyne LeCroy QPHY-USB3-Tx-Rx automated test solution is the only solution that fully integrates transmitter and receiver testing into one test suite.

Using the Teledyne LeCroy Protocol-enabled Receiver and Transmitter Tolerance Tester (PeRT3), QPHY-USB3-Tx-Rx has the ability to perform all of the SuperSpeed USB receiver tests as described by the SuperSpeed USB specification. Also, the PeRT3 can connect to the device under test, set the device to output the proper test pattern or enter loopback mode and output the proper test pattern. Then QPHY-USB3-Tx-Rx uses the SDA 813Zi oscilloscope to perform all of the SuperSpeed USB transmitter measurements as described by the SuperSpeed USB specification. All of this can be done simply with the push of a button.

Additionally, since all of these tests are run from QPHY-USB3-Tx-Rx, the results of the transmitter test as well as the receiver results can be created in one comprehensive report.

The Eye Doctor II analysis software allows the user to view their signal after Continuous Time Linear Equalization (CTLE). QPHY-USB3-Tx-Rx uses this functionality to create the eye diagram and measure the jitter after CTLE as required by the SuperSpeed USB Compliance Specification.

Teledyne LeCroy’s SDA II analysis software contains integrated jitter and timing analysis for clock and data signals. It allows analysis of data up to the memory limit of the oscilloscope and using X-Stream II technology, SDA II can display eye diagrams and jitter decomposition results up to 50 times faster than other solutions. Additionally, the specific PLL for SuperSpeed USB is selectable from a list of pre-configured PLLs. Lastly, SDA II can accurately measure jitter when there is a very long repeating pattern as is used in the USB3 by taking advantage of its very long memory or using a method that does not require the pattern to repeat allowing for measurements or small acquisitions.

Additionally, the Eye Doctor II analysis software also enables channel emulation. For USB 3.0 testing, a design engineer will perform their serial data measurement at the output of the transmitter. However, the specification requires that the measurements be made at the far side of a reference serial data channel. To accomplish this they could either use a physical channel to make their measurement after the channel or they can use channel emulation to see what their serial data signal would look like if it had been transmitted through the channel.

QPHY-USB3-Tx-Rx utilizes this functionality to automatically emulate the reference compliance channel prior to eye diagram and jitter testing.

QPHY-USB3-Tx-Rx Test Coverage
  • Template Test (Eye Diagram)
  • Total Jitter
  • Deterministic Jitter
  • Random Jitter
  • SSC Modulation Rate
  • SSC Modulation Deviation
  • Pk-Pk Differential Voltage
  • Low Power Pk-Pk Differential Voltage
  • Unit Interval
  • SSC Slew Rate
  • De-emphasis Voltage Ratio
  • Transmitter Min Pulse
  • DC Common Mode Voltage
  • AC Common Mode Voltage
  • LFPS tPeriod
  • LFPS tBurst
  • LFPS tRepeat
  • SIGTEST Integration
  • Integrated Receiver Testing using the Teledyne LeCroy PeRT3